J.J. Joos, K. Lejaeghere, K. Korthout, A. Feng, D. Poelman, P.F. Smet ISBN/ISSN:TalkConference / event / venue Workshop on Charge Trapping Defects in Semiconductors and InsulatorsYork, UKMonday, 20 March, 2017 to Tuesday, 21 March, 2017