High-throughput screening of extrinsic point defect properties in Si and Ge DFT

M. Sluydts, M. Pieters, J. Vanhellemont, V. Van Speybroeck

ISBN/ISSN:

Talk

Conference / event / venue

Annual Scientific Meeting of the Belgian Physical Society 2015

Liège, Belgium

Wednesday, 13 May, 2015 to Monday, 13 June, 2016