Michaël Pieters

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A1 Publications

Published

2016

High-Throughput Screening of Extrinsic Point Defect Properties in Si and Ge: Database and Applications , M. Sluydts, M. Pieters, J. Vanhellemont, V. Van Speybroeck, S. Cottenier , Chemistry of Materials , 29 (3), pp 975–984 , 2016 , IF: 9.41

Other Publications

Dissertations

(D2) , Computational Materials Design: Intrinsieke en extrinsieke puntdefecten in Silicium en Germanium , M. Pieters , Supervisor(s): Prof. Dr. Stefaan Cottenier, Prof. Dr. J. Vanhellemont , 2012

Keynote / Plenary / Invited talks

Talks

2015

Tuning Vacancy Trapping by Impurities in Si and Ge by High-Throughput Selection , M. Sluydts, M. Pieters, J. Vanhellemont, V. Van Speybroeck, S. Cottenier , IWMCG-8 , Spa, Belgium , Sun, 15/11/2015 to Wed, 18/11/2015
High-throughput screening of extrinsic point defect properties in Si and Ge DFT , M. Sluydts, M. Pieters, J. Vanhellemont, V. Van Speybroeck , Annual Scientific Meeting of the Belgian Physical Society 2015 , Liège, Belgium , Wed, 13/05/2015 to Mon, 13/06/2016
High-throughput screening of extrinsic point defect properties in Si and Ge , M. Sluydts, M. Pieters, J. Vanhellemont, V. Van Speybroeck, S. Cottenier , Euro-TMCS I , Granada, Spain , 19 , Wed, 28/01/2015 to Fri, 30/01/2015

Posters

2017

High-Throughput Screening of Extrinsic Point Defect Properties in Si and Ge: Database and Applications , M. Sluydts, M. Pieters, J. Vanhellemont, V. Van Speybroeck, S. Cottenier , International Workshop on Machine Learning for Materials Science , Espoo, Finland , Wed, 08/03/2017 to Thu, 09/03/2017

2016

Tuning vacancy trapping by impurities in Si and Ge through high-throughput selection , M. Sluydts, M. Pieters, J. Vanhellemont, V. Van Speybroeck, S. Cottenier , EMRS Spring Meeting 2016 , Lille, France , Mon, 02/05/2016 to Fri, 06/05/2016

Funding